Mathematical Challenges in Electron Microscopy: Volume 232 (Advances in Imaging and Electron Physics #232) (Hardcover)

Mathematical Challenges in Electron Microscopy: Volume 232 (Advances in Imaging and Electron Physics #232) By Peter W. Hawkes (Editor), Martin Hÿtch (Editor) Cover Image
By Peter W. Hawkes (Editor), Martin Hÿtch (Editor)
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This is book number 232 in the Advances in Imaging and Electron Physics series.

Description


Mathematical Challenges in Electron Microscopy, Volume 232 of Advances in Imaging and Electron Physics series, highlights new advances in the field, with this new volume presenting interesting chapters on topics, including Charged Particles in Electromagnetic Fields, Language of Aberration Expansions in Charged Particle Optics, Transporting Charged Particle Beams in Static Fields, Transporting Charged Particles in Radiofrequency Fields, Transporting and Separating Ions in Gas-Filled Channels, Static Magnetic Charged Particle Analyzers, Electrostatic Energy Analyzers, Mass Analyzers With Combined Electrostatic and Magnetic Fields, and much more.

Additional chapters cover Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.


Product Details
ISBN: 9780443297861
ISBN-10: 044329786X
Publisher: Academic Press
Publication Date: October 1st, 2024
Pages: 232
Language: English
Series: Advances in Imaging and Electron Physics