Advances in Imaging and Electron Physics: Volume 225 (Hardcover)

Advances in Imaging and Electron Physics: Volume 225 By Peter W. Hawkes (Editor), Martin Hÿtch (Editor) Cover Image
By Peter W. Hawkes (Editor), Martin Hÿtch (Editor)
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This is book number 225 in the Advances in Imaging and Electron Physics series.

Description

Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics


Product Details
ISBN: 9780443193262
ISBN-10: 0443193266
Publisher: Academic Press
Publication Date: April 1st, 2023
Pages: 284
Language: English
Series: Advances in Imaging and Electron Physics
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