Advances in Imaging and Electron Physics, 162: Optics of Charged Particle Analyzers (Hardcover)

Advances in Imaging and Electron Physics, 162: Optics of Charged Particle Analyzers Cover Image
By Peter W. Hawkes (Editor)
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This is book number 162 in the Advances in Imaging and Electron Physics series.

Description


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.



Product Details
ISBN: 9780123813169
ISBN-10: 0123813166
Publisher: Academic Press
Publication Date: June 30th, 2010
Pages: 275
Language: English
Series: Advances in Imaging and Electron Physics